vaizdas | dalies numeris | markė | apibūdinimas | kiekis | Pirkti |
---|---|---|---|---|---|
SDFSD |
Package S32QW SDFSD TEST New original parts |
11712 pieces |
|||
NULL |
Package SMD or Through Hole NULL TEST-1-GR New original parts |
32921 pieces |
|||
ORIGINAL |
Package QFN-6 ORIGINAL TEST-2 New original parts |
68185 pieces |
|||
ONsemi |
Package PLCC28 ONsemi TEST RUN New original parts |
69690 pieces |
|||
BCD |
Package TO-220 BCD TEST1 New original parts |
35721 pieces |
|||
ORIGINAL |
Package SOD523 ORIGINAL test12 New original parts |
65270 pieces |
|||
ORIGINAL |
Package SOD523 ORIGINAL test123 New original parts |
65270 pieces |
|||
TI |
Package TSSOP56 TI TEST123456789 New original parts |
21476 pieces |
|||
NS |
Package TSSOP-28 NS TEST1H2S04 New original parts |
23506 pieces |
|||
ORIGINAL |
Package QFN ORIGINAL TEST1QFN7X7 New original parts |
9212 pieces |
|||
Vishay Semiconductor Opto Division |
PHOTOTRANSISTOR NPN SIDE VIEW |
441135 pieces |
|||
ORIGINAL |
Package QFN ORIGINAL TEST6 New original parts |
9212 pieces |
|||
PERICOM |
Package QFN64 PERICOM TEST7.5X7.5 New original parts |
56628 pieces |
|||
TEMIC |
Package SOP-24L TEMIC TESTDE New original parts |
22072 pieces |
|||
ORIGINAL |
Package SMD ORIGINAL TESTDELAM New original parts |
19112 pieces |
|||
AIT |
Package QFN AIT TESTDIE4X3-1 New original parts |
18880 pieces |
|||
ONsemi |
Package PLCC28 ONsemi TESTING-EFREN New original parts |
69690 pieces |
|||
ORIGINAL |
Package SMTDIP ORIGINAL TESTMADC1-20090723_13:17 New original parts |
4600 pieces |
|||
PGM |
Package SMD or Through Hole PGM TESTMADC1-20120404_10:20 New original parts |
21920 pieces |
|||
PGM |
Package SMD or Through Hole PGM TESTMADC2_20090723_13:18 New original parts |
21798 pieces |